- Powerful 32/32 array inspection with conventional UT channel.
- Create your own inspection ‘Apps” or use pre-installed apps on the device.
- Easy to use PA device, light and compact.
- Reduce training costs with customizable touch-screen user interface.
- Streamline reporting and analysis with on-board wireless connectivity and data export.
- Pair with GE’s industry leading dual-element linear DM probes.
- One touch button auto reporting.