Enquire Brochure

• Powerful 32/32 array inspection with conventional UT channel.
• Create your own inspection ‘Apps” or use pre-installed apps on the device.
• Easy to use PA device, light and compact.
• Reduce training costs with customizable touch-screen user interface.
• Streamline reporting and analysis with on-board wireless connectivity and data export.
• Pair with GE’s industry leading dual-element linear DM probes.
• One touch button auto reporting.